சுருக்கம்

Characterization of Pani-PVAC Composite Thin Films Using Xrd Analysis

N. S. Wadatkar and S. A. Waghuley

Polyaniline (PANI) is the one of the most promising conducting polymer due to a good combination of properties, stability, price and ease of synthesis by different routes. In this study, PANI and poly (vinyl acetate) (PVAc) composite thin films were synthesized by chemical oxidative polymerization method with the solution of ammonium per sulphate as an oxidant in methanol. The films were prepared with 10-50 wt. % of PVAc. The thickness was in the range of 1-4 μm for all films. The films were characterized by XRD technique. This method can be used to show the perfection of PVAc network structure in the composite. XRD technique has been used to determine the possible crystallinity in the composite films. The XRD of all samples was carried in the 2θ range from 10 to 100 degree.